Lee Wai Tak Joseph = Fe₃₋xZnxO₄的真空熱處理效應及磁隧道結 / 李懷德. / On t.p. "-x" and "x" is subscript. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2006. / Includes bibliographical references. / Text in English; abstracts in English and Chinese. / Lee Wai Tak Joseph = Fe₃₋xZnxO₄ de zhen kong re chu li xiao ying ji ci sui dao jie / Li Huaide. / Acknowledgement --- p.i / Abstract --- p.ii / 論文摘要 --- p.iii / Table of contents --- p.iv / List of Figures --- p.ix / List of Tables --- p.xiv / Table of Contents / Chapter Chapter 1 --- Introduction / Chapter 1.1 --- Introduction to Magnetite Fe3O4 and Zinc Ferrite Fe3.-xZnxO4 --- p.1-1 / Chapter 1.1.1 --- Crystal structure and Properties of Fe304 and Fe3-xZnxo4 --- p.1-1 / Chapter 1.1.2 --- Transformation of Iron Oxides --- p.1-6 / Chapter 1.2 --- Verwey transition --- p.1-10 / Chapter 1.2.1 --- Introduction --- p.1-10 / Chapter 1.2.2 --- Charge-orbital ordering --- p.1-15 / Chapter 1.3 --- Trilayer Magnetic Tunneling Junction (MTJ) --- p.1-18 / Chapter 1.3.1 --- Half-metallic Fe3O4 --- p.1-18 / Chapter 1.3.2 --- Tunneling Magnetoresistance (TMR) --- p.1-19 / Chapter 1.4 --- Research Motivation --- p.1-20 / Chapter 1.5 --- Scope of this thesis --- p.1-21 / References --- p.1-22 / Chapter Chapter 2 --- Instrumentation / Chapter 2.1 --- Sample Preparation --- p.2-1 / Chapter 2.1.1 --- Vacuum System --- p.2-1 / Chapter 2.1.2 --- Facing-target Sputtering (FTS) Technique --- p.2-3 / Chapter 2.2 --- Sample Treatment --- p.2-7 / Chapter 2.2.1 --- Vacuum Annealing (VA) --- p.2-7 / Chapter 2.2.2 --- Silver Electrode Coating System --- p.2-9 / Chapter 2.3 --- Sample Characterization --- p.2-11 / Chapter 2.3.1 --- Four-point-probe DC Resistivity Measurement --- p.2-11 / Chapter 2.3.2 --- Current-Voltage Measurement (IV) --- p.2-11 / Chapter 2.3.3. --- X-ray Diffraction (XRD) --- p.2-13 / Chapter 2.3.4 --- X-ray Fluorescence (XRF) Method --- p.2-14 / Chapter 2.3.5 --- Alpha-step Surface Profiler --- p.2-14 / Chapter 2.3.6 --- Atomic Force Microscope (AFM) --- p.2-15 / References --- p.2-16 / Chapter Chapter 3 --- Fabrication of Fe3- xZnxO4Thin Films / Chapter 3.1 --- Thin Film Deposition --- p.3-1 / Chapter 3.1.1 --- Review of Deposition Procedures --- p.3-1 / Chapter 3.1.2 --- Preparation of Substrates --- p.3-6 / Chapter 3.1.3 --- Deposition of Fe3-xZnxO4 thin films --- p.3-7 / Chapter 3.2 --- Characterization of Fe3-xZnxO4 thin films --- p.3-9 / Chapter 3.2.1 --- Surface Morphology --- p.3-9 / Chapter 3.2.2 --- Temperature-Dependent Resistivity Measurement --- p.3-11 / Chapter 3.3 --- Factors affecting the Quality of films --- p.3-18 / Chapter 3.3.1 --- Effect of Substrates --- p.3-18 / Chapter 3.3.2 --- Effects of Sputtering Power --- p.3-21 / Chapter 3.3.3 --- Effects of Temperature --- p.3-24 / Chapter 3.3.4 --- Effects of Thickness --- p.3-29 / Chapter 3.4 --- Chapter summary --- p.3-32 / References --- p.3-33 / Chapter Chapter 4 --- Vacuum Annealing of Fe3-xZnxO4 Thin Films / Chapter 4.1 --- Introduction --- p.4-1 / Chapter 4.2 --- Post-Annealing Effect in the Presence of Oxygen --- p.4-6 / Chapter 4.3 --- Vacuum Annealing of Fe3-xZnx04 thin films --- p.4-12 / Chapter 4.3.1 --- First Stage of Vacuum Annealing --- p.4-12 / Chapter 4.3.2 --- Second Stage of Vacuum Annealing --- p.4-17 / Chapter 4.3.3 --- Third Stage of Vacuum Annealing --- p.4-25 / Chapter 4.4 --- Chapter summary --- p.4-32 / References --- p.4-33 / Chapter Chapter 5 --- Trilayer Magnetic Tunneling Junction (MTJ) / Chapter 5.1 --- Introduction --- p.5-1 / Chapter 5.2 --- Fabrication of Trilayer Magnetic Tunneling Junction --- p.5-3 / Chapter 5.3 --- Tunneling Magnetoresistance (TMR) --- p.5-5 / Chapter 5.3.1 --- Current-Voltage Characteristic Curve (IV curve) --- p.5-5 / Chapter 5.3.2 --- Magnetoresistance Measurement --- p.5-8 / References --- p.5-10 / Chapter Chapter 6 --- Conclusions / Chapter 6.1 --- Conclusions --- p.6-1 / Chapter 6.2 --- Further research --- p.6-2 / References --- p.6-3
Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_325693 |
Date | January 2006 |
Contributors | Lee, Wai Tak Joseph., Chinese University of Hong Kong Graduate School. Division of Physics. |
Source Sets | The Chinese University of Hong Kong |
Language | English, Chinese |
Detected Language | English |
Type | Text, bibliography |
Format | print, 1 v. (various pagings) : ill. ; 30 cm. |
Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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