Thermo-mechanical reliability models for life prediction of area array electronics in extreme environments

Description

Thesis(M.S.)--Auburn University, 2006. / Abstract. Vita. Includes bibliographic references.

Links & Downloads

1. http://repo.lib.auburn.edu/2006%20Spring/master's/SINGH_NAVEEN_54.pdf

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/228816646
Date	January 2006
Creators	Singh, Naveen Chandra, Lall, Pradeep.
Publisher	Auburn, Ala. ,
Source Sets	OCLC
Language	English
Detected Language	English