Signal processing from modern microscopes for local characteristics of materials Image processing is more and more important for the advancement of image evaluation taken from microscopes. This thesis engages the problem of artefact detection and removal from images taken by electron microscope, more accurately by low energy electron microscopy (LEEM). It then offers a possible course of processing such images by edge detection and its theoretical use. These operations are all made in MatLAB language.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:220056 |
| Date | January 2013 |
| Creators | Kaspar, Pavel |
| Contributors | Sadovský, Petr, Tománek, Pavel |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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