The x-ray atomic form-factor determines the x-ray optical properties of materials and is a fundamental parameter for critical x-ray investigations. However, despite uncertainty estimates of order 1%, differences of 2-10% between x-ray mass attenuation measurements render comparison with the various theoretical tabulations meaningless. Moreover, such uncertainties impose limits on the accuracy of various quantitative investigations. We determine the imaginary component of the atomic form-factor from measurements of the x-ray mass attenuation coefficient. With the exception of the measurements of Tran et.al. [Phys. Rev. A 64, (062506); 67, (042716); J. Phys. B 38, (89)] with a 0.3% accuracy, previous work has been unable to achieve accuracies below 1%, and differences between results claiming this accuracy often exceed 6%.We have developed a full-foil mapping technique which has improved the measurement accuracy by an order of magnitude. This technique overcomes limitations arising from absorber thickness variations, using the average integrated column density and attenuation measurements across the entire surface of the absorber. We have examined measurements obtained over a wide range of parameter space for systematic deviations indicative of experimental error. Among others, this has led to the identification and correction of a 1% discrepancy arising from the x-ray bandwidth. Resulting measurement accuracies for molybdenum are 0.02-0.15%. Preliminary results for tin suggest a final accuracy of 0.1-1%. We compare these measurements with several commonly-used tabulations and identify a number of systematic discrepancies whose causes are discussed.
| Identifer | oai:union.ndltd.org:ADTP/245162 |
| Creators | de Jonge, Martin D. |
| Source Sets | Australiasian Digital Theses Program |
| Language | English |
| Detected Language | English |
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