Optimal design of VLSI structures with built-in self test based on reduced pseudo-exhaustive testing

Description

Thesis (Ph. D.)--Ohio University, November, 1992. / Title from PDF t.p.

Links & Downloads

1. http://www.ohiolink.edu/etd/view.cgi?ohiou1173755841

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/212214432
Date	January 1992
Creators	Pimenta, Tales Cleber.
Publisher	Ohio : Ohio University,
Source Sets	OCLC
Language	English
Detected Language	English
Source	Connect to resource online