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Surface defect classification based on one-dimensional sensors and structured illumination /

Zugl.: Erlangen, Nürnberg, University, Diss., 2008.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/316577010
Date January 2008
CreatorsCaulier, Yannick.
PublisherAachen : Shaker,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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