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A study of failure locus of NPN transistors and its improvement using graded collector structures

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.328404

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:328404
Date	January 1988
Creators	Humphreys, M. J.
Publisher	University of Liverpool
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation