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An investigation of transmission electron microscopy specimen artifacts resulting from focused ion beam and conventional preparation techniques

No description available.

1. https://stars.library.ucf.edu/rtd/1983

Identifer	oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-2982
Date	01 April 2000
Creators	Shannon, Carrie Urbanik
Publisher	STARS
Source Sets	University of Central Florida
Language	English
Detected Language	English
Type	text
Source	Retrospective Theses and Dissertations