The purpose of this study was to explore the relationship among service quality, brand image, customer relationship management, and customer satisfaction for ¡§T company¡¨ of semiconductor raw wafer agent. The differences of the above constructs in terms of official position, service department, and size and production categories were also evaluated.
This study selected samples from the semiconductor industries and enterprises in Taiwan. Out of the 8 firms, 76 questionnaires were sent, 76 valid questionnaires were returned from 8 firms, resulting in a valid response rate of 100%. The statistic software SPSS were applied for the data analysis and major findings of this study were as follows:
1.The service quality in terms of ¡§tangibles¡¨, ¡§reliability¡¨, ¡§responsiveness¡¨,¡§empathy¡¨ and ¡§ total¡¨ had significant and positive effects on customer relationship management, brand image, and customer satisfaction. Moreover, the effect of the ¡§total¡¨ was the most significant one; on the contrary, the effect of the ¡§tangibles¡¨ was the least significant one.
2.The customer satisfaction of ¡§T company¡¨of semiconductor raw wafer agent had significant and positive effects on the customer relationship management and brand image. Among the customer relationship management and brand image, the former was more significant than the latter.
3. According to the results of diverseness analysis, there were no significant differences between service department, size and production categories and service quality, customer relationship management, brand image, and customer satisfaction.
4. Small-scale-size firms tended to have higher rate than large-scale-size firms on service quality, customer relationship management, brand image, andcustomer satisfaction.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0622112-171947 |
| Date | 22 June 2012 |
| Creators | Wang, Chien-Yao |
| Contributors | Pei-How Huang, Cher-Min Fong, Cher-Hung Tseng |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0622112-171947 |
| Rights | unrestricted, Copyright information available at source archive |
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