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Design techniques to improve time dependent dielectric breakdown based failure for CMOS circuits a thesis /

Thesis (M.S.)--California Polytechnic State University, 2010. / Mode of access: Internet. Title from PDF title page; viewed on Jan. 21, 2010. Major professor: John Oliver. "Presented to the Electrical Engineering Department faculty of California Polytechnic State University, San Luis Obispo." "In partial fulfillment of the requirements for the Master of Science degree in Electrical Engineering." "January 2010." Includes bibliographical references (p. 119-121).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/501334772
Date January 1900
CreatorsTarog, Emanuel, Oliver, John Y.
Publisher[San Luis Obispo, Calif. : California Polytechnic State University],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick here to view

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