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Accumulator Based Test Set Embedding

In this paper a test set embedding based on accumulator driven by an odd additive constant is presented. The problem is formulated around finding the location of the test pattern in the sequence generated by the accumulator, given a odd constant C and test set T, in terms of linear Diophantine equation of two variables. We show that the search space for finding the best constant corresponding to the shortest length, is greatly reduced. Experimental results show a significant improvement in run time with practically acceptable test length.

Identiferoai:union.ndltd.org:siu.edu/oai:opensiuc.lib.siu.edu:theses-1025
Date01 January 2009
CreatorsSudireddy, Samara Simha Reddy
PublisherOpenSIUC
Source SetsSouthern Illinois University Carbondale
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceTheses

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