This thesis deals with the utilization of new principles of characterization of gate capacitances for sigma-delta modulators. Sigma-delta modulators are the integral part of sigma-delta analog-to-digital converters. The proposed new method is characterized by high resolution and modest requirements for laboratory equipment. It allows characterizing capacitances whose values are within the range which is used in sigma-delta modulators. The thesis contains description of the new method, the analysis of measurement accuracy and experimental results.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:233499 |
| Date | January 2009 |
| Creators | Sutorý, Tomáš |
| Contributors | Ďuračková, Daniela, Husák, Miroslav, Kolka, Zdeněk |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/doctoralThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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