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Direct solid sample analysis by electrothermal vaporization inductively coupled plasma atomic emission spectrometry and mass spectrometry

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:rn3012815
Date January 1994
CreatorsRen, Jian Min
ContributorsSalin, Eric D. (Supervisor)
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 41752, Proquest: NN94705

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