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Evaluation of the effect of heat on the slurry technique for inductively coupled plasma atomic emission spectrometry

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:5712m778g
Date January 1989
CreatorsGervais, Lyne
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 59402, Proquest: AAIMM63572

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