Photoreflectance (PR) is a sensitive technique to measure semiconductor properties at room temperature due to its derivative nature. The normalized
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0719112-164318 |
| Date | 19 July 2012 |
| Creators | Liao, You-Fen |
| Contributors | Dong-Po Wang, Chi-Huang Lin, Bae-heng Tseng |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0719112-164318 |
| Rights | user_define, Copyright information available at source archive |
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