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Methodology for electrical characterization of MOS devices with alternative gate dielectrics

Darmstadt, Techn. University, Diss., 2004. / Dateien im PDF-Format.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/76686735
Date January 2004
CreatorsKerber, Andreas.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceLF

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