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Electron-Ion Time-of-Flight Coincidence Measurements of K-K Electron Capture, Cross Sections for Nitrogen, Methane, Ethylene, Ethane, Carbon Dioxide and Argon (L-K) Targets

Protons with energies ranging from 0.4 to 2.0 MeV were used to measure K-shell vacancy production cross sections (oVK) for N_2, CH_4, C_2H_4, C_2H_6, and CO_2 gas targets under single collision conditions. An electron-ion time-of-flight coincidence technique was used to determind the ration of the K-K electron capture cross section, OECK, to the K-vacancy production cross section, oVK. These ratios were then combined with the measured values of oVK to extract the K-K electron capture cross sections. Measurements were also made for protons of the same energy range but with regard to L-shell vacancy production and L-K electron capture for Ar targets. In addition, K-K electron capture cross sections were measured for 1.0 to 2.0 Mev 42He^_ ions on CH_4.

Identiferoai:union.ndltd.org:unt.edu/info:ark/67531/metadc331079
Date05 1900
CreatorsToten, Arvel D.
ContributorsMcDaniel, Floyd Del. (Floyd Delbert), 1942-, Sears, Raymond E., Duggan, Jerome L., Deering, William D., Mackey, H. J.
PublisherNorth Texas State University
Source SetsUniversity of North Texas
LanguageEnglish
Detected LanguageEnglish
TypeThesis or Dissertation
Formativ, 155 leaves: ill., Text
RightsPublic, Toten, Arvel D., Copyright, Copyright is held by the author, unless otherwise noted. All rights reserved.

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