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Using electric cell-substrate impedance sensing (ECIS) to measure properties of an individual adherent cell /

Thesis (Ph. D.)--University of Washington, 2008. / Vita. Includes bibliographical references (leaves 85-94).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/439047399
Date January 2008
CreatorsPahnit Seriburi,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeTheses
SourceConnect to this title online; UW restricted

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