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Charge trapping instabilities in amorphous silicon/silicon nitride thin film transistors

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:381605
Date January 1988
CreatorsHepburn, A. R.
PublisherOpen University
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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