The present work provides charge state fractions that may be used to generate TEAMS relative sensitivity factors for impurities in semiconductor materials.
| Identifer | oai:union.ndltd.org:unt.edu/info:ark/67531/metadc278340 |
| Date | 12 1900 |
| Creators | Renfrow, Steven N. (Steven Neal) |
| Contributors | McDaniel, Floyd Del. (Floyd Delbert), 1942-, Duggan, Jerome L., Weathers, Duncan L. |
| Publisher | University of North Texas |
| Source Sets | University of North Texas |
| Language | English |
| Detected Language | English |
| Type | Thesis or Dissertation |
| Format | v, 84 leaves : ill., Text |
| Rights | Public, Copyright, Copyright is held by the author, unless otherwise noted. All rights reserved., Renfrow, Steven N. (Steven Neal) |
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