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Caracterização elétrica de dispositivos e circuitos integrados

Dissertação (mestrado)—Universidade de Brasília, Faculdade de Tecnologia, Departamento de Engenharia Elétrica, 2008. / Submitted by Aline Jacob (alinesjacob@hotmail.com) on 2010-01-21T20:08:52Z
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Previous issue date: 2008-08-13 / Neste trabalho foi desenvolvido e implementado um modelo de estrutura para caracterização e teste de dispositivos eletrônicos e circuitos integrados. Este modelo é capaz de validar uma grande variedade de dispositivos e circuitos integrados, inclusive protótipos de SoC (System on Chip). O modelo inclui bancadas de testes, instrumentação, procedimentos e automação de processos com a criação de programas usando LabVIEW R e GPIB. _________________________________________________________________________________________ ABSTRACT / In this work, a structure for characterization and test of electronic devices and integrated circuits was developed and implemented. That structure was used to validate a large variety of devices and integrated circuits, including SoC (System on Chip) prototypes. The structure includes test benches, instrumentation, and automated measurement procedures, based upon GPIB bus with software applications developed with the LabVIEW platform.

Identiferoai:union.ndltd.org:IBICT/oai:repositorio.unb.br:10482/3384
Date13 August 2008
CreatorsGuimarães, Hélder Henrique
ContributorsCosta, José Camargo da
Source SetsIBICT Brazilian ETDs
LanguagePortuguese
Detected LanguagePortuguese
Typeinfo:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/masterThesis
Sourcereponame:Repositório Institucional da UnB, instname:Universidade de Brasília, instacron:UNB
Rightsinfo:eu-repo/semantics/openAccess

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