Investigations of perspective materials for aggressively scaled gate stacks and contact structures of MOS devices

Description

Brandenburgische Techn. University, Diss., 2002--Cottbus.

Links & Downloads

1. http://se6.kobv.de:8000/btu/volltexte/2007/72/
2. http://se6.kobv.de:8000/btu/volltexte/2007/72/pdf/diss_goryachko.pdf
3. http://deposit.d-nb.de/cgi-bin/dokserv?idn=968309127

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/175099955
Creators	Goryachko, Andriy.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Online-Publikation.