Return to search

Physical mechanisms, device models, and lifetime projections of hot-carrier effects in CMOS transistors

Graduation date: 1994

Identiferoai:union.ndltd.org:ORGSU/oai:ir.library.oregonstate.edu:1957/35625
Date29 November 1993
CreatorsHwang, Nam
ContributorsForbes, Leonard
Source SetsOregon State University
Languageen_US
Detected LanguageEnglish
TypeThesis/Dissertation

Page generated in 0.0021 seconds