Thesis (MScEng)--University of Stellenbosch, 2004. / ENGLISH ABSTRACT: Flash memory and the errors induced in it by radiation were studied. A test board was
then designed and developed as well as a radiation test program. The system was irradiated.
This gave successful results, which confirmed aspects of the study and gave valuable
insight into flash memory behaviour. To date, the board is still being used to test various
flash devices for radiation-harsh environments.
A memory protection unit (MPU) was conceptually designed and developed to morntor
flash devices, increasing their reliability in radiation-harsh environments. This unit
was designed for intended use onboard a micro-satellite. The chosen flash device for this
study was the K9F1208XOA model from SAMSUNG. The MPU was designed to detect,
maintain, mitigate and report radiation induced errors in this flash device. Most of the
design was implemented in field programmable gate arrays and was realised using VHDL.
Simulations were performed to verify the functionality of the design subsystems. These
simulations showed that the various emulated errors were handled successfully by the
MPU.
A modular design methodology was followed, therefore allowing the chosen flash device
to be replaced with any flash device, following a small reconfiguration. This also allows
parts of the system to be duplicated to protect more than one device. / AFRIKAANSE OPSOMMING: 'n Studie is gemaak van" Flash" geheue en die foute daarop wat deur radiasie veroorsaak
word. 'n Toetsbord is ontwerp en ontwikkel asook 'n radiasie toetsprogram waarna die
stelsel bestraal is. Die resultate was suksesvol en het aspekte van die studie bevestig en
belangrike insig gegee ten opsigte van "flash" komponente in radiasie intensiewe omgewmgs.
'n Geheue Beskermings Eenheid (GBE) is konseptueel ontwerp en ontwikkelom die "flash"
komponente te monitor. Dit verhoog die betroubaarheid in radiasie intensiewe omgewings.
Die eenheid was ontwerp met die oog om dit aan boord 'n mikro-satelliet te gebruik.
Die gekose "flash" komponent vir die studie was die K9F1208XOA model van SAMSUNG.
Die GBE is ontwerp om foute wat deur radiasie geïnduseer word in die "flash" komponent
te identifiseer, herstel en reg te maak. Die grootste deel van die implementasie is gedoen
in "field programmable gate arrays" and is gerealiseer deur gebruik te maak van VHDL.
Simulasies is gedoen om die funksionaliteit van die ontwikkelde substelsels te verifieer.
Hierdie simulasies het getoon dat die verskeie geëmuleerde foute suksesvol deur die GBE
hanteer is.
'n Modulre ontwerpsmetodologie is gevolg sodat die gekose "flash" komponent deur enige
ander flash komponent vervang kan word na gelang van 'n eenvoudige herkonfigurasie.
Dit stelook dele van die sisteem in staat om gedupliseer te word om sodoende meer as
een komponent te beskerm.
| Identifer | oai:union.ndltd.org:netd.ac.za/oai:union.ndltd.org:sun/oai:scholar.sun.ac.za:10019.1/50070 |
| Date | 12 1900 |
| Creators | Bryer, Bevan |
| Contributors | Bakkes, P. J., Stellenbosch University. Faculty of Engineering. Dept. of Electrical and Electronic Engineering. |
| Publisher | Stellenbosch : Stellenbosch University |
| Source Sets | South African National ETD Portal |
| Language | en_ZA |
| Detected Language | English |
| Type | Thesis |
| Format | 129 p. : ill. |
| Rights | Stellenbosch University |
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