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Distributable defect localization using Markov models /

Thesis (Ph. D.)--University of Washington, 2005. / Vita. Includes bibliographical references (p. 135-146).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/70659305
Date January 2005
CreatorsPortnoy, William,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeTheses
SourceConnect to this title online; UW restricted

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