Return to search

Estimating reliability impact of biometric devices in large scale applications

Thesis (M.S.)--West Virginia University, 2003. / Title from document title page. Document formatted into pages; contains vii, 66 p. : ill. (some col.). Vita. Includes abstract. Includes bibliographical references (p. 62-64).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/52966961
Date January 2003
CreatorsMahadevan, Karthikeyan.
PublisherMorgantown, W. Va. : [West Virginia University Libraries],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

Page generated in 0.0015 seconds