Return to search

Infrared measurement and analytical prediction of the transient temperature distribution on computer boards

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/17897
Date08 1900
CreatorsSheffield, Randolph Joseph
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

Page generated in 0.001 seconds