This thesis presents the conducted electro-magnetic interference (EMI) prediction results for a continuous conduction mode (CCM) power factor correction (PFC) converter as well as the theoretical analysis for the noise generation and propagation mechanisms.
In this thesis, multiple modeling and characterization techniques in the medium and high frequency ranges are developed for the circuit components that are important contributors to the EMI noise, so that a detailed simulation circuit for EMI prediction can be constructed.
The conducted EMI noise prediction from the simulation circuit closely matches the measurement results obtained by a spectrum analyzer. Simulation time step and noise separator selection are two important issues for the noise simulation and measurement. These two issues are addressed and the solutions are proposed.
The conducted EMI generation and propagation mechanisms are analyzed in a systematic way. Two loop models are proposed to explain the EMI noise behavior. The effects of the PFC inductor, the parasitic capacitance between the device and the heatsink, the rising/falling time of the MOSFET VDS voltage, and the input wires are studied to verify the validity of the loop models. / Master of Science
| Identifer | oai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/35226 |
| Date | 06 October 2003 |
| Creators | Yang, Liyu |
| Contributors | Electrical and Computer Engineering, Lee, Fred C., van Wyk, Jacobus Daniel, Odendaal, Willem Gerhardus |
| Publisher | Virginia Tech |
| Source Sets | Virginia Tech Theses and Dissertation |
| Detected Language | English |
| Type | Thesis |
| Format | application/pdf |
| Rights | In Copyright, http://rightsstatements.org/vocab/InC/1.0/ |
| Relation | Liyu_Yang_ETD.pdf |
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