Yip Hin-lap = 以PEDOT:PSS為本的高份子發光器件中銦的擴散之研究 / 葉軒立. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2003. / Includes bibliographical references (leaves 113). / Text in English; abstracts in English and Chinese. / Yip Hin-lap = Yi PEDOT:PSS wei ben de gao fen zi fa guang qi jian zhong yin de kuo san zhi yan jiu / Ye Xuanli. / Abstract --- p.ii / 論文摘要 --- p.iv / Acknowledgements --- p.v / Table of Contents --- p.vi / List of Figures --- p.x / List of Tables --- p.xii / Chapter CHAPTER 1 --- INTRODUCTION --- p.1 / Chapter 1.1 --- Overview --- p.1 / Chapter 1.2 --- Conjugated Polymer --- p.3 / Chapter 1.2.1 --- Electronic and Geometric Configuration --- p.3 / Chapter 1.2.2 --- Charge Carriers --- p.7 / Chapter 1.2.3 --- Concept of Doping --- p.9 / Chapter 1.2.4 --- Electrical Conductivity and Charge Transport Mechanisms --- p.15 / Chapter 1.3 --- "Poly(3,4-ethylenedioxythiophene) [PEDOT]" --- p.16 / Chapter 1.4 --- Polymer Light Emitting Diodes --- p.20 / Chapter 1.4.1 --- Device Fabrication --- p.21 / Chapter 1.4.2 --- Material Design and Properties --- p.23 / Chapter 1.4.3 --- Interface and surface of PLED --- p.25 / Chapter 1.5 --- """Chemistry"" and Diffusion at Interface" --- p.27 / Chapter 1.6 --- Surface/Interface Modification with Self-Assembled Monolayers --- p.30 / Chapter 1.7 --- Aims of This Thesis --- p.33 / References --- p.34 / Chapter CHAPTER 2 --- INSTRUMENTATION --- p.38 / Chapter 2.1 --- X-ray Photoelectron Spectroscopy --- p.38 / Chapter 2.1.1 --- Fundamental Theory of XPS --- p.39 / Chapter 2.1.2 --- Qualitative Analysis using XPS --- p.43 / Chapter 2.1.2.1 --- Chemical Shifts --- p.43 / Chapter 2.1.2.2 --- Shake-up satellites --- p.45 / Chapter 2.1.2.3 --- Valence band structure --- p.45 / Chapter 2.1.3 --- Quantitative Analysis Using XPS --- p.46 / Chapter 2.1.4 --- Depth Profiling --- p.47 / Chapter 2.1.4.1 --- Non-Destructive Method Using Angled-Resolved XPS --- p.47 / Chapter 2.1.4.2 --- Destructive Method Using Ion Sputtering --- p.49 / Chapter 2.1.5 --- Instrumental Setup of XPS --- p.49 / Chapter 2.2 --- PLED Fabrication and Characterization System --- p.51 / Chapter 2.3 --- Current-Voltage-Luminescence (I-V-L) Measurement --- p.53 / Chapter 2.4 --- Electrical Measurement --- p.54 / Chapter 2.5 --- Kelvin Probe Measurement --- p.55 / Chapter 2.6 --- pH Measurement --- p.56 / Chapter 2.7 --- Film Thickness Measurement --- p.56 / Chapter 2.8 --- Contact Angle Measurement --- p.57 / References --- p.60 / Chapter CHAPTER 3 --- STABILITY OF PEDOT:PSS/ITO INTERFACE --- p.61 / Chapter 3.1 --- Introduction --- p.61 / Chapter 3.2 --- Sample Preparation --- p.62 / Chapter 3.3 --- Results and Discussion --- p.63 / Chapter 3.3.1 --- XPS of Core levels in PEDOT:PSS --- p.63 / Chapter 3.3.1.1 --- XPS of S 2p Core Level --- p.64 / Chapter 3.3.1.2 --- XPS of O Is Core Level --- p.66 / Chapter 3.3.1.3 --- XPS of C Is Core Level --- p.68 / Chapter 3.3.2 --- Composition Analysis of PEDOT:PSS Films --- p.71 / References --- p.80 / Chapter CHAPTER 4 --- ELECTRICAL AND ELECTRONIC PROPERTIES OF PEDOT:PSS WITH DISSOLUTED INDIUM --- p.81 / Chapter 4.1 --- Introduction --- p.81 / Chapter 4.2 --- Sample Preparation --- p.81 / Chapter 4.2.1 --- Four-Point Probe Measurement --- p.82 / Chapter 4.2.2 --- Current-Voltage Measurement --- p.82 / Chapter 4.2.3 --- Work Function Measurement --- p.83 / Chapter 4.2.4 --- XPS Experiment --- p.83 / Chapter 4.3 --- Results and Discussion --- p.85 / Chapter 4.3.1 --- Electrical Properties of PEDOT:PSS --- p.86 / Chapter 4.3.2 --- Electronic Properties of PEDOT:PSS --- p.89 / References --- p.97 / Chapter CHAPTER 5 --- BLOCKING REACTIONS BETWEEN ITO AND PEDOT:PSS WITH A SELF-ASSEMBLY MONOLAYER --- p.98 / Chapter 5.1 --- Introduction --- p.98 / Chapter 5.2 --- Sample Preparation --- p.99 / Chapter 5.3 --- Result and Discussion --- p.103 / Chapter 5.3.1 --- In Diffusion Blocking Effect by SAM --- p.103 / Chapter 5.3.2 --- PLED Devices Performance --- p.107 / References --- p.113 / Chapter CHAPTER 6 --- CONCLUSION --- p.114 / Chapter CHAPTER 7 --- FURTHER WORKS --- p.116
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_324452 |
| Date | January 2003 |
| Contributors | Yip, Hin-lap., Chinese University of Hong Kong Graduate School. Division of Materials Science and Engineering. |
| Source Sets | The Chinese University of Hong Kong |
| Language | English, Chinese |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, xii, 117 leaves : ill. ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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