Luo Yun. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2004. / Includes bibliographical references. / Abstracts in English and Chinese. / Abstract --- p.i / 论文摘要 --- p.ii / Acknowledgements --- p.iii / Table of Contents --- p.iv / List of Figures --- p.vii / List of Tables --- p.xi / Chapter Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- Conjugated Polymers --- p.1 / Chapter 1.1.1 --- Overview --- p.1 / Chapter 1.1.2 --- Conducting Polymers --- p.2 / Chapter 1.2 --- Electrochemical Doping of Conjugated Polymers --- p.5 / Chapter 1.2.1 --- Doping Conjugated Polymers --- p.7 / Chapter 1.2.2 --- Doping Level --- p.8 / Chapter 1.3 --- Charges in Conjugated Polymers --- p.10 / Chapter 1.3.1 --- Electronic and Geometric Configurations --- p.10 / Chapter 1.3.2 --- Charge Carriers --- p.10 / Chapter 1.4 --- Effects of Localization and Structural Disorder on Conductivity --- p.18 / Chapter 1.5 --- Cyclic Voltammetric Behavior of Conjugated Polymers --- p.18 / Chapter 1.6 --- PEDOT: PSS Systems --- p.21 / Chapter 1.7 --- Motivation --- p.25 / References --- p.27 / Chapter Chapter 2 --- Instrumentation --- p.32 / Chapter 2.1 --- X-ray Photoelectron Spectroscopy --- p.32 / Chapter 2.1.1 --- Introduction --- p.32 / Chapter 2.1.2 --- Basic Principles and Theory --- p.32 / Chapter 2.1.3 --- Qualitative Analysis Using XPS --- p.35 / Chapter 2.1.4 --- Angular Effect on XPS --- p.35 / Chapter 2.1.5 --- Chemical Shifts --- p.35 / Chapter 2.1.6 --- Valence Band Investigation --- p.37 / Chapter 2.1.7 --- Quantitative Analysis Using XPS --- p.37 / Chapter 2.1.8 --- Instrumental Setup for XPS --- p.40 / Chapter 2.2 --- Scanning Probe Microscopy --- p.40 / Chapter 2.2.1 --- General Introduction --- p.40 / Chapter 2.2.2 --- Atomic Force Microscopy and Conducting Atomic Force Microscopy --- p.40 / Chapter 2.2.3 --- Instrumental Setup for Conducting AFM --- p.44 / Chapter 2.3 --- Cyclic Voltammetry --- p.44 / Chapter 2.4 --- Kelvin Probe --- p.46 / Chapter 2.5 --- a-step Profilometer --- p.48 / References --- p.49 / Chapter Chapter 3 --- Cyclic Voltammetric Characterization of PEDOT:PSS --- p.51 / Chapter 3.1 --- Film Preparations --- p.51 / Chapter 3.2 --- Electrochemistry --- p.52 / Chapter 3.3 --- Results and Discussions --- p.53 / References --- p.56 / Chapter Chapter 4 --- Electronic Structure of Doped and Dedoped PEDOT:PSS Systems --- p.57 / Chapter 4.1 --- Introduction --- p.57 / Chapter 4.2 --- Sample Preparations --- p.58 / Chapter 4.3 --- Results and Discussions --- p.60 / Chapter 4.3.1 --- XPS of C 1s Core Level of PEDOT:PSS --- p.61 / Chapter 4.3.2 --- XPS of S 2p Core Level of PEDOT:PSS --- p.66 / Chapter 4.3.3 --- XPS of O Is Core Level of PEDOT:PSS --- p.71 / Chapter 4.3.4 --- XPS of Valence Band of PEDOT:PSS --- p.77 / Chapter 4.3.5 --- Further Explanations and Discussions --- p.77 / Chapter 4.4 --- Kevin Probe Measurement --- p.83 / Chapter 4.5 --- Conclusions --- p.83 / References --- p.85 / Chapter Chapter 5 --- Morphology and Nano-scale Electrical Properties of PEDOT:PSS Thin Film --- p.87 / Chapter 5.1 --- Introduction --- p.87 / Chapter 5.2 --- Sample Preparations --- p.87 / Chapter 5.3 --- Results and Discussions --- p.88 / Chapter 5.3.1 --- CAFM on as Prepared PEDOT.PSS and Ar+ Sputtered Thin Film --- p.88 / Chapter 5.3.2 --- CAFM on pH Dedoped PEDOT:PSS (pH=6.6) --- p.95 / Chapter 5.3.3 --- CAFM on Electrochemically Dedoped PEDOTrPSS --- p.98 / Chapter 5.4 --- Conclusions --- p.105 / References --- p.106 / Chapter Chapter 6 --- Concluding Remarks and Future Work --- p.107 / Chapter 6.1 --- Concluding Remarks --- p.107 / Chapter 6.2 --- Future Work --- p.108
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_324992 |
| Date | January 2004 |
| Contributors | Luo, Yun., Chinese University of Hong Kong Graduate School. Division of Physics. |
| Source Sets | The Chinese University of Hong Kong |
| Language | English, Chinese |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, xi, 108 leaves : ill. (some col.) ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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