Two dimensional (2D) materials with interesting fundamental physics and potential applications attract tremendous efforts to study. The versatile properties of 2D materials can be further tailored by tuning the electronic structure with the layer-stacking arrangement, of which the main adjustable parameters include the thickness and the in-plane twist angle between layers. The Angle-Resolved Photoemission Spectroscopy (ARPES) has become a canonical tool to study the electronic structure of crystalline materials. The recent development of ARPES with sub-micrometre spatial resolution (micro-ARPES) has made it possible to study the electronic structure of materials with mesoscopic domains. In this thesis, we use micro-ARPES to investigate the spatially-resolved electronic structure of a series of few-layer materials: 1. We explore the electronic structure of the domains with different number of layers in few-layer graphene on copper substrate. We observe a layer- dependent substrate doping effect in which the Fermi surface of graphene shifts with the increase of number of layers, which is then explained by a multilayer effective capacitor model. 2. We systematically study the twist angle evolution of the energy band of twisted few-layer graphene over a wide range of twist angles (from 5° to 31°). We directly observe van Hove Singularities (vHSs) in twisted bilayer graphene with wide tunable energy range over 2 eV. In addition, the formation of multiple vHSs (at different binding energies) is observed in trilayer graphene. The large tuning range of vHS binding energy in twisted few-layer graphene provides a promising material base for optoelectrical applications with broad-band wavelength selectivity. 3. To better extract the energy band features from ARPES data, we propose a new method with a convolutional neural network (CNN) that achieves comparable or better results than traditional derivative based methods. Besides ARPES study, this thesis also includes the study of surface reconstruction for the layered material Bi2O2Se with the analysis of Scanning Tunnelling Microscopy (STM) images. To explain the origin of the pattern, we propose a tile model that produces the identical statistics with the experiment.
| Identifer | oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:757823 |
| Date | January 2018 |
| Creators | Peng, Han |
| Contributors | Chen, Yulin |
| Publisher | University of Oxford |
| Source Sets | Ethos UK |
| Detected Language | English |
| Type | Electronic Thesis or Dissertation |
| Source | http://ora.ox.ac.uk/objects/uuid:2f3503eb-93bf-48d6-b6fb-13409b925748 |
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