Return to search

A nano coordinate machine for optical dimensional metrology

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/16525
Date05 1900
CreatorsKirkland, Eric Alan
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageItalian
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

Page generated in 0.0018 seconds