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Methodology for predicting microelectronic substrate warpage incorporating copper trace pattern characteristics

Thesis (M. S.)--Mechanical Engineering, Georgia Institute of Technology, 2009. / Committee Chair: Sitaraman, Suresh; Committee Member: Peak, Russell; Committee Member: Ume, Charles

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/429049578
Date January 2008
CreatorsMcCaslin, Luke
PublisherAtlanta, Ga. : Georgia Institute of Technology,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceAvailable online, Georgia Institute of Technology:

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