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Fundamental studies of copper diffusion barriers

Thesis (Ph. D.)--University of Texas at Austin, 2004. / Supervisor: John G. Ekerdt. Vita. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/67988095
Date January 2004
CreatorsEngbrecht, Edward Raymond, Ekerdt, John G.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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