The goal of this thesis is to analyze and to find solutions of optimization problems derived from automation of functional verification of hardware using artificial neural networks. Verification of any integrated circuit (so called Design Under Verification, DUV) using technique called coverage-driven verification and universal verification methodology (UVM) is carried out by sending stimuli inputs into DUV. The verification environment continuously monitors percentual coverage of DUV functionality given by the specification. In current context, coverage stands for measurable property of DUV, like count of verified arithemtic operations or count of executed lines of code. Based on the final coverage, it is possible to determine whether the coverage of DUV is high enough to declare DUV as verified. Otherwise, the input stimuli set needs to change in order to achieve higher coverage. Current trend is to generate this set by technique called constrained-random stimulus generation. We will practice this technique by using pseudorandom program generator (PNG). In this paper, we propose multiple solutions for following two optimization problems. First problem is ongoing modification of PNG constraints in such a way that the DUV can be verified by generated stimuli as quickly as possible. Second one is the problem of seeking the smallest set of stimuli such that this set verifies DUV. The qualities of the proposed solutions are verified on 32-bit application-specific instruction set processors (ASIPs) called Codasip uRISC and Codix Cobalt.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:363776 |
| Date | January 2017 |
| Creators | Fajčík, Martin |
| Contributors | Husár, Adam, Zachariášová, Marcela |
| Publisher | Vysoké učení technické v Brně. Fakulta informačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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