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A probe of structural defects in YBCO thin films using XRD and Raman microscopy

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:322209
Date January 2000
CreatorsGibson, Gary
PublisherImperial College London
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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