In this work a low voltage and highly linear current-mode current to delay (CTD) converter is presented. The proposed current to delay converter has the improved linearity of about 23.5% when compared with a conventional–delay inverter over the input dynamic current range of 50µA. When used as front-end block in current-mode delay-mode analog to digital converter an 11-bit resolution is obtained. The design is implemented in TSMC 90 nm CMOS technology. Monte Carlo analysis and process corner analysis is performed on the proposed circuit to analyze the amount of mismatch that will degrade the performance of the circuit in a system level. A Process, Voltage, and Temperature (PVT) variation insensitive circuit is used to bias the designed CTD converter to obtain 57% reduction of variation when compared with the simple current mode biasing technique.
| Identifer | oai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:NSHD.ca#10222/44103 |
| Date | 23 January 2014 |
| Creators | Thulukkameetheen, Mohideen Raiz |
| Source Sets | Library and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada |
| Language | English |
| Detected Language | English |
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