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Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis

This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.

Identiferoai:union.ndltd.org:wpi.edu/oai:digitalcommons.wpi.edu:etd-theses-1336
Date26 April 2012
CreatorsAnderson, Evan V
ContributorsMingjiang Tao, Committee Member, Qi Wen, Committee Member, Terri A. Camesano, Advisor, Nancy A. Burnham, Advisor
PublisherDigital WPI
Source SetsWorcester Polytechnic Institute
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceMasters Theses (All Theses, All Years)

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