In this thesis, we develop some inferential results for one-shot device testing data analysis. These extend and generalize existing methods in the literature.
First, a competing-risk model is introduced for one-shot testing data under accelerated life-tests. One-shot devices are products which will be destroyed immediately after use. Therefore, we can observe only a binary status as data, success or failure, of such products instead of its lifetime. Many one-shot devices contain multiple components and failure of any one of them will lead to the failure of the device. Failed devices are inspected to identify the specific cause of failure. Since the exact lifetime is not observed, EM algorithm becomes a natural tool to obtain the maximum likelihood estimates of the model parameters. Here, we develop the EM algorithm for competing exponential and Weibull cases.
Second, a semi-parametric approach is developed for simple one-shot device testing data. Semi-parametric estimation is a model that consists of parametric and non-parametric components. For this purpose, we only assume the hazards at different stress levels are proportional to each other, but no distributional assumption is made on the lifetimes. This provides a greater flexibility in model fitting and enables us to examine the relationship between the reliability of devices and the stress factors.
Third, Bayesian inference is developed for one-shot device testing data under exponential distribution and Weibull distribution with non-constant shape parameters for competing risks. Bayesian framework provides statistical inference from another perspective. It assumes the model parameters to be random and then improves the inference by incorporating expert's experience as prior information. This method is shown to be very useful if we have limited failure observation wherein the maximum likelihood estimator may not exist.
The thesis proceeds as follows. In Chapter 2, we assume the one-shot devices to have two components with lifetimes having exponential distributions with multiple stress factors. We then develop an EM algorithm for developing likelihood inference for the model parameters as well as some useful reliability characteristics. In Chapter 3, we generalize to the situation when lifetimes follow a Weibull distribution with non-constant shape parameters. In Chapter 4, we propose a semi-parametric model for simple one-shot device test data based on proportional hazards model and develop associated inferential results. In Chapter 5, we consider the competing risk model with exponential lifetimes and develop inference by adopting the Bayesian approach. In Chapter 6, we generalize these results on Bayesian inference to the situation when the lifetimes have a Weibull distribution. Finally, we provide some concluding remarks and indicate some future research directions in Chapter 7. / Thesis / Doctor of Philosophy (PhD)
| Identifer | oai:union.ndltd.org:mcmaster.ca/oai:macsphere.mcmaster.ca:11375/19438 |
| Date | January 2016 |
| Creators | So, Hon Yiu |
| Contributors | Balakrishnan, Narayanaswamy, Mathematics and Statistics |
| Source Sets | McMaster University |
| Language | English |
| Detected Language | English |
| Type | Thesis |
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