The thesis introduces new semiconductor structures that are used as protections against Electrostatic Discharge occuring in integrated circuits. The fundamental structure for modeling and simulation has been lateral Silicon Controlled Rectifier. This SCR structure has been modificated to enable tuning of the triggering and holding voltages by changing geometrical mask dimensions. On the base of modeling and simulation the new proposed structures have been published. Also several protection structures have been designed to be manufactured and measured on a testchip. The final electrical behavior has been verified by measurement. Finally, the focus has been aided to protection circuit with bipolar transistor. This approach has been also simulated and verified by measurement. Advantages and disadvantages of the proposed protection structures are commented in the thesis.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:233447 |
| Date | January 2009 |
| Creators | Běťák, Petr |
| Contributors | Sládek,, Petr, Bartoň,, Zdeněk, Musil, Vladislav |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/doctoralThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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