Extended plasticity mechanisms (EPM) allow a metal to undergo extended plastic deformation without failure. These mechanisms are responsible for the extended plastic deformation characteristic of hot working processes. In this thesis it is shown that electron backscatter diffraction (EBSD) is capable of detecting EPM artifacts in the final microstructure of AISI 304L stainless steel (304L). Results also indicate that dislocation cells form in hot worked AISI 304L stainless steel. Additionally, in this study EBSD data collection and analysis is used with a design of experiments approach to model the presence of EPM artifacts in the final microstructure of friction stir welded 304L. Texture analysis of the welded material reveals a dominant shear deformation texture and a lack of the rotated cube texture. The shear deformation texture is characteristic of dynamic recovery (DRV) and continuous dynamic recrystallization (CDRX), while the rotated cube texture is characteristic of discontinuous dynamic recrystallization (DDRX). The texture analysis results indicate that dynamic recovery (DRV) and continuous dynamic recrystallization (CDRX) play a role in the final microstructure of the welded material, while DDRX does not. Design of experiments was used to find the relationships between the fraction of cell boundaries and spindle speed, travel speed, location in the stir zone, and tool temperature. The regression analyses reported that predicted fraction of cell boundaries were relatively high (approximately 0.70 or more) and changed by less that 20% in the stir zone and 10% in the TMAZ. The relatively high predictions indicate that in FSW 304L DRV dominates and limited CDRX occurs. The small changes in predictions across the experimental space indicate that the effects, while statistically significant, are not practically significant. Finally, an alternate tool temperature basis was developed, which provides a valid method for selecting welds which should have constant tool temperature.
| Identifer | oai:union.ndltd.org:BGMYU2/oai:scholarsarchive.byu.edu:etd-3581 |
| Date | 29 July 2010 |
| Creators | Nelson, Benjamin D. |
| Publisher | BYU ScholarsArchive |
| Source Sets | Brigham Young University |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Theses and Dissertations |
| Rights | http://lib.byu.edu/about/copyright/ |
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