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Automatic test data generation

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/9167
Date08 1900
CreatorsOffutt, Andrew Jefferson, VI
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Languageen_US
Detected LanguageItalian
TypeDissertation
Format240 bytes, text/html
RightsAccess restricted to authorized Georgia Tech users only.

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