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Studies of electron irradiation induced deep level defects in p-type 6H-SIC

Thesis (M. Phil.)--University of Hong Kong, 2009. / Includes bibliographical references. Also available in print.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/319468652
Date January 2009
CreatorsLuo, Jiaming,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick to view the E-thesis via HKUTO

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