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Capacitance Spectroscopy of Point Defects in Silicon and Silicon Carbide

No description available.
Identiferoai:union.ndltd.org:UPSALLA/oai:DiVA.org:kth-3205
Date January 2001
CreatorsÃ…berg, Denny
PublisherKTH, Microelectronics and Information Technology, IMIT, Kista : Mikroelektronik och informationsteknik
Source SetsDiVA Archive at Upsalla University
LanguageEnglish
Detected LanguageEnglish
TypeDoctoral thesis, comprehensive summary, text
RelationTrita-FTE, 0284-0545 ; 2001:5

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