Delay Test Scan Flip-Flop c(DTSFF) design and its applications for scan based delay testing

Description

Dissertation (Ph.D.)--Auburn University, 2007. / Abstract. Vita. Includes bibliographic references (p.107-111).

Links & Downloads

1. http://repo.lib.auburn.edu/2007%20Fall%20Dissertations/Xu_Gefu_18.pdf

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/243871440
Date	January 2007
Creators	Xu, Gefu, Singh, Adit D.
Publisher	Auburn, Ala. ,
Source Sets	OCLC
Language	English
Detected Language	English