Yes / The advances in the Internet of Things (IoT) has substantially contributed to the automation of modern societies by making physical things around us more interconnected and remotely controllable over the internet. This technological progress has inevitably created an intelligent society where various mechatronic systems are becoming increasingly efficient, innovative, and convenient. Undoubtedly, the IoT paradigm will continue to impact human life by providing efficient control of the environment with minimum human intervention. However, despite the ubiquity of IoT devices in modern society, the dependability of IoT applications remains a crucial challenge. Accordingly, this paper systematically reviews the current status and challenges of IoT dependability frameworks. Based on the review, existing IoT dependability frameworks are mainly based on informal reliability models. These informal reliability models are unable to effectively evaluate the unified treatment safety faults and cyber-security threats of IoT systems. Additionally, the existing frameworks are also unable to deal with the conflicting interaction between co-located IoT devices and the dynamic features of self-adaptive, reconfigurable, and other autonomous IoT systems. To this end, this paper suggested the design of a novel model-based dependability framework for quantifying safety faults and cyber-security threats as well as interdependencies between safety and cyber-security in IoT ecosystems. Additionally, robust approaches dealing with conflicting interactions between co-located IoT systems and the dynamic behaviours of IoT systems in reconfigurable and other autonomous systems are required.
Identifer | oai:union.ndltd.org:BRADFORD/oai:bradscholars.brad.ac.uk:10454/19327 |
Date | 03 February 2023 |
Creators | Abdulhamid, Alhassan, Kabir, Sohag, Ghafir, Ibrahim, Lei, Ci |
Publisher | IEEE |
Source Sets | Bradford Scholars |
Language | English |
Detected Language | English |
Type | Conference paper, Accepted manuscript |
Rights | © 2022 IEEE. Reproduced in accordance with the publisher's self-archiving policy., Unspecified |
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