Return to search

Depth profile determination of stratified layers using internal reflection spectroscopy

No description available.
Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:case1060700279
Date January 1993
CreatorsShick, Robert Adam
PublisherCase Western Reserve University School of Graduate Studies / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=case1060700279
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

Page generated in 0.0019 seconds