Light-emitting diodes (LEDs) offer energy-efficient lighting and are widely adopted. However, LED drivers that regulate power can fail when subjected to voltage disturbances on the electrical grid. This research investigates how components within LED drivers durability when undergoing voltage impulses and swells using simulation-based methods. An LED driver circuit was modeled in LTspice circuit simulation software. Impulses from 35-65V and equivalent voltage swells were applied to the simulated driver. The electrical stresses on components were statistically analyzed using the design of experiments and general full factorial. This methodology identified the most vulnerable components and their common durability/failure mechanisms during impulse and swell events. The findings provide insights into design changes that harden drivers against grid disturbances. This study determines that higher capacitor voltage ratings improved voltage impulse and swell withstand. Additionally, adding a surge suppression diode across the LED minimized diode reverse breakdown during swells. This simulation-based approach enables the informed design of robust LED drivers that can withstand electrical grid perturbations through strategic hardening of the most vulnerable components. The methodology and findings provide a framework for the reliability optimization of LED drivers and other power electronic systems exposed to power quality disturbances.Keywords: LED driver, voltage disturbance, component failure, circuit simulation, design of experiments (DOE), general full factorial.
| Identifer | oai:union.ndltd.org:siu.edu/oai:opensiuc.lib.siu.edu:dissertations-3194 |
| Date | 01 December 2023 |
| Creators | Tabash, Farhan Y. |
| Publisher | OpenSIUC |
| Source Sets | Southern Illinois University Carbondale |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Dissertations |
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