Characterization and modeling of dielectric-charging effects in RF MEMS capacitive switches /

Description

Thesis (Ph. D.)--Lehigh University, 2006. / Includes vita. Includes bibliographical references (leaves 86-90).

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/137242669
Date	January 2006
Creators	Yuan, Xiaobin,
Source Sets	OCLC
Language	English
Detected Language	English
Type	Academic dissertations