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Behavioral modeling and simulaitons [sic] of mixed-signal integrated circuits with process variations and physical defects /

Thesis (Ph. D.)--University of Rhode Island, 2003. / Typescript. Includes bibliographical references (leaves 96-102).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/56502747
Date January 2003
CreatorsGuo, Yu-yau.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView online ; access limited to URI

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